New metal plating compositions

ABSTRACT

Reaction products of primary and secondary diamines and bisanhydrides are included as additives in metal electroplating baths. The metal electroplating baths have good throwing power and deposit metal layers having substantially planar surfaces. The metal plating baths may be used to deposit metal on substrates with surface features such as through-holes and vias.

FIELD OF THE INVENTION

The present invention is directed to reaction products of bisanhydrides and diamines as additives for electroplating baths. More specifically, the present invention is directed to reaction products of bisanhydrides and diamines as additives for electroplating baths to provide electroplating baths which have good throwing power.

BACKGROUND OF THE INVENTION

Methods for electroplating articles with metal coatings generally involve passing a current between two electrodes in a plating solution where one of the electrodes is the article to be plated. A typical acid copper plating solution includes dissolved copper, usually copper sulfate, an acid electrolyte such as sulfuric acid in an amount sufficient to impart conductivity to the bath, a source of halide, and proprietary additives to improve the uniformity of the plating and the quality of the metal deposit. Such additives include levelers, accelerators and suppressors, among others.

Electrolytic copper plating solutions are used in a variety of industrial applications, such as decorative and anticorrosion coatings, as well as in the electronics industry, particularly for the fabrication of printed circuit boards and semiconductors. For circuit board fabrication, typically, copper is electroplated over selected portions of the surface of a printed circuit board, into blind vias and trenches and on the walls of through-holes passing between the surfaces of the circuit board base material. The exposed surfaces of blind vias, trenches and through-holes, i.e. the walls and the floor, are first made conductive, such as by electroless metal plating, before copper is electroplated on surfaces of these apertures. Plated through-holes provide a conductive pathway from one board surface to the other. Vias and trenches provide conductive pathways between circuit board inner layers. For semiconductor fabrication, copper is electroplated over a surface of a wafer containing a variety of features such as vias, trenches or combinations thereof. The vias and trenches are metallized to provide conductivity between various layers of the semiconductor device.

It is well known in certain areas of plating, such as in electroplating of printed circuit boards (“PCBs”), that the use of levelers in the electroplating bath can be crucial in achieving a uniform metal deposit on a substrate surface. Electroplating a substrate having irregular topography can pose difficulties. During electroplating a voltage drop typically occurs within apertures in a surface which can result in an uneven metal deposit between the surface and the apertures. Electroplating irregularities are exacerbated where the voltage drop is relatively extreme, that is, where the apertures are narrow and tall. Consequently, a metal layer of substantially uniform thickness is frequently a challenging step in the manufacture of electronic devices. Leveling agents are often used in copper plating baths to provide substantially uniform, or level, copper layers in electronic devices.

The trend of portability combined with increased functionality of electronic devices has driven the miniaturization of PCBs. Conventional multilayer PCBs with through-hole interconnects are not always a practical solution. Alternative approaches for high density interconnects have been developed, such as sequential build up technologies, which utilize blind vias. One of the objectives in processes that use blind vias is the maximizing of via filling while minimizing thickness variation in the copper deposit between the vias and the substrate surface. This is particularly challenging when the PCB contains both through-holes and blind vias.

Leveling agents are used in copper plating baths to level the deposit across the substrate surface and to improve the throwing power of the electroplating bath. Throwing power is defined as the ratio of the through-hole center copper deposit thickness to the copper thickness at the surface. Newer PCBs are being manufactured that contain both through-holes and blind vias. Current bath additives, in particular current leveling agents, do not always provide level copper deposits between the substrate surface and filled through-holes and blind vias. Via fill is characterized by the difference in height between the copper in the filled via and the surface. Accordingly, there remains a need in the art for leveling agents for use in metal electroplating baths for the manufacture of PCBs that provide level copper deposits while bolstering the throwing power of the bath.

SUMMARY OF THE INVENTION

A reaction product of one or more diamines including primary or secondary amine moieties and one or more compounds having formula:

where R is a linking group.

Compositions include one or more sources of metal ions, an electrolyte and a reaction product of one or more diamines including primary or secondary amine moieties and one or more compounds having formula:

where R is a linking group.

Methods include providing a substrate; providing a composition including one or more sources of metal ions, an electrolyte and one or more reaction products of one or more diamines including primary or secondary amine moieties and one or more compounds having formula:

where R is a linking group; contacting the substrate with the composition; applying a current to the substrate; and plating a metal on the substrate.

The electroplating baths which include the reaction products provide substantially level metal layers across a substrate, even on substrates having small features and on substrates having a variety of feature sizes. The metal plating compositions have good throwing power and effectively deposit metals in blind vias and through-holes.

DETAILED DESCRIPTION OF THE INVENTION

As used throughout this specification the following abbreviations shall have the following meanings unless the context clearly indicates otherwise: A=amperes; A/dm²=amperes per square decimeter=ASD; ° C.=degrees Centigrade; g=gram; mg=milligram; ppm=parts per million=mg/L; mol=moles; L=liter, μm=micron=micrometer; mm=millimeters; cm=centimeters; PO=propyleneoxide; EO=ethyleneoxide; DI=deionized; mL=milliliter; Mw=weight average molecular weight; and Mn=number average molecular weight; and v/v=volume to volume. All numerical ranges are inclusive and combinable in any order, except where it is clear that such numerical ranges are constrained to add up to 100%.

As used throughout the specification, “feature” refers to the geometries on a substrate. “Aperture” refers to recessed features including through-holes and blind vias. As used throughout this specification, the term “plating” refers to metal electroplating. “Deposition” and “plating” are used interchangeably throughout this specification. “Halide” refers to fluoride, chloride, bromide and iodide. “Accelerator” refers to an organic additive that increases the plating rate of the electroplating bath and such accelerators may also function as brighteners. “Suppressor” refers to an organic additive that suppresses the plating rate of a metal during electroplating. “Leveler” refers to an organic compound that is capable of providing a substantially level or planar metal layer. The terms “leveler” and “leveling agent” are used interchangeably throughout this specification. The terms “printed circuit boards” and “printed wiring boards” are used interchangeably throughout this specification. The term “moiety” means a part of a molecule or polymer that may include either whole functional groups or parts of functional groups as substructures. The terms “moiety” and “group” are used interchangeably throughout the specification. The indefinite articles “a” and “an” refer to the singular and the plural.

Compounds are reaction products of one or more diamines including primary or secondary amine moieties and one or more compounds having formula:

where R is a linking group joined by covalent bonds to the nitrogen of the anhydride rings. Such linking groups are organic moieties. Preferably R has the following structures:

where R₁ and R₂ may be the same or different and include hydrogen, linear or branched (C₁-C₄)alkyl, hydroxyl, hydroxy(C₁-C₃)alkyl, carboxyl, carboxy(C₁-C₃)alkyl and (C₁-C₃)alkoxy, preferably, R₁ and R₂ include hydrogen or linear or branched (C₁-C₄)alkyl, more preferably, R₁ and R₂ are hydrogen and m is an integer of 1 to 15, preferably from 2 to 10, more preferably from 2 to 3;

where R₁ and R₂ are defined as above; R₃ and R₄ may be the same or different and are the same groups as R₁ and R₂; R₅ and R₆ may be the same or different and include hydrogen, carboxyl and carboxy(C₁-C₃)alkyl, preferably R₅ and R₆ may be the same or different and are hydrogen and carboxyl; and m is as defined above and n is an integer of 1 to 15, preferably from 2 to 10, more preferably from 2 to 3 and preferably m and n are the same;

where R₇, R₈, R₉ and R₁₀ may be the same or different and include hydrogen, linear or branched (C₁-C₅)alkyl, linear or branched hydroxy(C₁-C₅)alkyl, carboxy(C₁-C₃)alkyl, linear or branched (C₁-C₅)alkoxy, preferably R₇, R₈, R₉ and R₁₀ may be the same or different and are hydrogen, linear or branched (C₁-C₅)alkyl, more preferably R₇, R₈, R₉ and R₁₀ are hydrogen; q, r and t may be the same or different and are integers of 1 to 10, preferably from 2 to 3; and

where R₁₁ and R₁₂ may be the same or different and are hydrogen or linear or branched (C₁-C₅)alkyl, preferably R₁₁ and R₁₂ are hydrogen, Ar is an aryl group having 5 to 6 carbon atoms, preferably 6 carbon atoms, more preferably R of formula (V) has the following structure:

and n is as defined above.

Diamines include compounds having a general formula:

where R′ is a linking group joined by covalent bonds to the terminal nitrogens. Such linking groups are organic moieties. Preferably R′ has the following structures:

a substituted or unsubstituted (C₆-C₁₈)aryl;

where R₁₃ and R₁₄ may be the same or different and include hydrogen, linear or branched (C₁-C₁₂)alkyl, alkyleneoxy or substituted or unsubstituted (C₆-C₁₈)aryl. Substituents on the aryl groups include, but are not limited to linear or branched (C₁-C₁₂)alkyl, linear or branched hydroxy(C₁-C₁₂)alkyl, hydroxyl, carboxyl, linear or branched carboxy(C₁-C₁₂)alkyl, nitro group, mercapto group, linear or branched mercapto(C₁-C₁₂)alkyl, linear or branched halo(C₁-C₁₂)alkyl, preferably the aryl is a six membered ring, more preferably the aryl is an unsubstituted six membered ring; variables p and s may be the same or different and are independently integers of one or greater, preferably from 1 to 10, variable e is an integer of 0 to 3, preferably from 1 to 2, more preferably e is 1 and variables a, b, c and d may be the same or different and are numbers from 1 or greater, preferably from 1 to 10; when R₁₃ and R₁₄ are alkyleneoxy, the terminal carbons of the alkyleneoxy groups may be taken together to form a ring with the proviso that when R₁₃ and R₁₄ are joined together to form the ring, R′ is also an alkyleneoxy group; R₁₅-R₂₂ may be the same or different and include hydrogen, linear or branched (C₁-C₅)alkyl, linear or branched hydroxy(C₁-C₅)alkyl or linear or branched (C₁-C₅)alkoxy; and Z may be a carbon atom or nitrogen atom.

Diamines also include, but are not limited to, heterocyclic saturated non-aromatic compounds having the following formula:

where R₂₃ and R₂₄ may be the same or different and are hydrogen or amino(C₁-C₁₀)alkyl, preferably R₂₃ and R₂₄ are hydrogen or amino(C₁-C₃)alkyl.

In general, the reaction products are prepared by mixing one or more bisanhydride compounds in an organic solvent, such as dimethylformamide (DMF), with stiffing and heating or with stiffing at room temperature. One or more diamines are then added dropwise to the mixture with heating and stiffing. Heating is typically done in a range of 50° C. to 150° C. This mixture may then be heated for 2 hours to 15 hours followed by bringing the temperature down to room temperature with stiffing. The product may be precipitated by adding anhydrous ethanol. The amounts of reactants may vary but in general sufficient amount of each reactant is added to provide a product where the molar ratio of the bisanhydride reactant to the amine reactant ranges from 1:0.1 to 1:2, preferably 1:0.5 to 1:2.

The reaction products may be polymers having inner salts such as those having a formula:

where R and R′ are as defined above and the variable v is 2 or greater. Preferably v is 2 to 200.

The plating composition and method are useful in providing a substantially level plated metal layer on a substrate, such as a printed circuit board. Also, the plating composition and method are useful in filling apertures in a substrate with metal. Also, the metal deposits have good throwing power.

Any substrate upon which metal can be electroplated is useful in the present invention. Such substrates include, but are not limited to: printed wiring boards, integrated circuits, semiconductor packages, lead frames and interconnects. An integrated circuit substrate may be a wafer used in a dual damascene manufacturing process. Such substrates typically contain a number of features, particularly apertures, having a variety of sizes. Through-holes in a PCB may have a variety of diameters, such as from 50 μm to 2 mm in diameter. Such through-holes may vary in depth, such as from 35 μm to 15 mm or greater. PCBs may contain blind vias having a wide variety of sizes, such as up to 200 μm diameter and 150 μm depth.

The metal plating compositions contain a source of metal ions, an electrolyte, and a leveling agent, where the leveling agent is a reaction product as described above. The metal plating compositions may contain a source of halide ions, an accelerator and a suppressor. Metals which may be electroplated from the compositions include, but are not limited to: copper, tin and tin/copper alloys.

Suitable copper ion sources are copper salts and include without limitation: copper sulfate; copper halides such as copper chloride; copper acetate; copper nitrate; copper tetrafluoroborate; copper alkylsulfonates; copper arylsulfonates; copper sulfamate; copper perchlorate and copper gluconate. Exemplary copper alkylsulfonates include copper (C₁-C₆)alkylsulfonate and more preferably copper (C₁-C₃)alkylsulfonate. Preferred copper alkylsulfonates are copper methanesulfonate, copper ethanesulfonate and copper propanesulfonate. Exemplary copper arylsulfonates include, without limitation, copper benzenesulfonate and copper p-toluene sulfonate. Mixtures of copper ion sources may be used. One or more salts of metal ions other than copper ions may be added to the present electroplating baths. Typically, the copper salt is present in an amount sufficient to provide an amount of copper metal of 10 to 400 g/L of plating solution.

Suitable tin compounds include, but are not limited to salts, such as tin halides, tin sulfates, tin alkane sulfonate such as tin methane sulfonate, tin aryl sulfonate such as tin benzenesulfonate and tin toluene sulfonate. The amount of tin compound in these electrolyte compositions is typically an amount that provides a tin content in the range of 5 to 150 g/L. Mixtures of tin compounds may be used in an amount as described above.

The electrolyte useful in the present invention may be alkaline or acidic. Typically the electrolyte is acidic. Suitable acidic electrolytes include, but are not limited to: sulfuric acid, acetic acid, fluoroboric acid, alkanesulfonic acids such as methanesulfonic acid, ethanesulfonic acid, propanesulfonic acid and trifluoromethane sulfonic acid, arylsulfonic acids such as benzenesulfonic acid and p-toluene sulfonic acid, sulfamic acid, hydrochloric acid, hydrobromic acid, perchloric acid, nitric acid, chromic acid and phosphoric acid. Mixtures of acids may be advantageously used in the present metal plating baths. Preferred acids include sulfuric acid, methanesulfonic acid, ethanesulfonic acid, propanesulfonic acid, hydrochloric acid and mixtures thereof. The acids may be present in an amount in the range of from 1 to 400 g/L. Electrolytes are generally commercially available from a variety of sources and may be used without further purification.

Such electrolytes may optionally contain a source of halide ions. Typically chloride ions are used. Exemplary chloride ion sources include copper chloride, tin chloride, sodium chloride and hydrochloric acid. A wide range of halide ion concentrations may be used in the present invention. Typically, the halide ion concentration is in the range of from 0 to 100 ppm based on the plating bath. Such halide ion sources are generally commercially available and may be used without further purification.

The plating compositions preferably contain an accelerator. Any accelerators (also referred to as brightening agents) are suitable for use in the present invention. Such accelerators are well-known to those skilled in the art. Accelerators include, but are not limited to, N,N-dimethyl-dithiocarbamic acid-(3-sulfopropyl)ester; 3-mercapto-propylsulfonic acid-(3-sulfopropyl)ester; 3-mercapto-propylsulfonic acid sodium salt; carbonic acid-dithio-o-ethylester-s-ester with 3-mercapto-1-propane sulfonic acid potassium salt; bis-sulfopropyl disulfide; bis-(sodium sulfopropyl)-disulfide; 3-(benzothiazolyl-s-thio)propyl sulfonic acid sodium salt; pyridinium propyl sulfobetaine; 1-sodium-3-mercaptopropane-1-sulfonate; N,N-di methyl-dithiocarbamic acid-(3-sulfoethyl)ester; 3-mercapto-ethyl propylsulfonic acid-(3-sulfoethyl)ester; 3-mercapto-ethylsulfonic acid sodium salt; carbonic acid-dithio-o-ethylester-s-ester with 3-mercapto-1-ethane sulfonic acid potassium salt; bis-sulfoethyl disulfide; 3-(benzothiazolyl-s-thio)ethyl sulfonic acid sodium salt; pyridinium ethyl sulfobetaine; and 1-sodium-3-mercaptoethane-1-sulfonate. Accelerators may be used in a variety of amounts. In general, accelerators are used in an amount of 0.1 ppm to 1000 ppm. Preferably, the accelerator concentration is in the range of 0.5 ppm to 100 ppm. More preferably, the accelerator concentration is in the range of 0.5 ppm to 50 ppm, and most preferably, in the range of 0.5 ppm to 25 ppm.

Any compound capable of suppressing the metal plating rate may be used as a suppressor in the present electroplating compositions. Suitable suppressors include, but are not limited to, polypropylene glycol copolymers and polyethylene glycol copolymers, including ethylene oxide-propylene oxide (“EO/PO”) copolymers and butyl alcohol-ethylene oxide-propylene oxide copolymers. Suitable butyl alcohol-ethylene oxide-propylene oxide copolymers are those having a weight average molecular weight of 100 to 100,000, preferably 500 to 10,000. When such suppressors are used, they are typically present in an amount in the range of from 1 to 10,000 ppm based on the weight of the composition, and more typically from 5 to 10,000 ppm.

In general, the reaction products have a number average molecular weight (Mn) of 200 to 10,000, typically from 300 to 50,000, preferably from 500 to 8000, although reaction products having other Mn values may be used. Such reaction products may have a weight average molecular weight (Mw) value in the range of 1000 to 50,000, typically from 5000 to 30,000, although other Mw values may be used.

The amount of the reaction product (leveling agent) used in the metal electroplating compositions depends upon the particular leveling agents selected, the concentration of the metal ions in the electroplating composition, the particular electrolyte used, the concentration of the electrolyte and the current density applied. In general, the total amount of the leveling agent in the electroplating composition ranges from 0.01 ppm to 5,000 ppm based on the total weight of the plating composition, although greater or lesser amounts may be used. Preferably, the total amount of the leveling agent is from 0.1 to 1000 ppm, more preferably, from 0.1 to 500 ppm, most preferably, from 0.1 to 100 ppm. In addition to their leveling activity, the reaction products may also function as suppressors.

The electroplating compositions may be prepared by combining the components in any order. It is preferred that the inorganic components such as source of metal ions, water, electrolyte and optional halide ion source are first added to the bath vessel followed by the organic components such as leveling agent, accelerator, suppressor, and any other organic component.

The electroplating compositions may optionally contain two or more leveling agents. Such additional leveling agents may be another leveling agent of the present invention, or alternatively, may be any conventional leveling agent. Suitable conventional leveling agents that can be used in combination with the present leveling agents include, without limitations, those disclosed in U.S. Pat. No. 6,610,192 to Step et al., U.S. Pat. No. 7,128,822 to Wang et al., U.S. Pat. No. 7,374,652 to Hayashi et al. and U.S. Pat. No. 6,800,188 to Hagiwara et al. Such combination of leveling agents may be used to tailor the characteristics of the plating bath, including leveling ability and throwing power.

Typically, the plating compositions may be used at any temperature from 10 to 65° C. or higher. Preferably, the temperature of the plating composition is from 10 to 35° C. and more preferably, from 15 to 30° C.

In general, the metal electroplating compositions are agitated during use. Any suitable agitation method may be used and such methods are well-known in the art. Suitable agitation methods include, but are not limited to air sparging, work piece agitation, and impingement.

Typically, a substrate is electroplated by contacting the substrate with the plating composition. The substrate typically functions as the cathode. The plating composition contains an anode, which may be soluble or insoluble. Potential is typically applied to the electrodes. Sufficient current density is applied and plating performed for a period of time sufficient to deposit a metal layer having a desired thickness on the substrate as well as fill blind vias, trenches and through-holes or to conformally plate through-holes. Current densities include, but are not limited to, the range of 0.05 to 10 A/dm², although higher and lower current densities may be used. The specific current density depends in part upon the substrate to be plated, the composition of the plating bath and the desired surface metal thickness. Such current density choice is within the abilities of those skilled in the art.

An advantage of the present invention is that substantially level metal deposits may be obtained on a PCB and other substrates. By “substantially level” metal layer is meant that the step height, i.e., the difference between areas of dense very small apertures and areas free of or substantially free of apertures, is less than 5 μm, and preferably, less than 1 μm. Through-holes and/or blind vias in the PCB are substantially filled. A further advantage of the present invention is that a wide range of apertures and aperture sizes may be filled.

Throwing power is defined as the ratio of the average thickness of the metal plated in the center of a through-hole compared to the average thickness of the metal plated at the surface of the PCB sample and is reported as a percentage. The higher the throwing power, the better the plating composition is able to conformally plate the through-hole.

The compounds provide metal layers having a substantially level surface across a substrate, even on substrates having small features and on substrates having a variety of feature sizes. The plating methods effectively deposit metals in through-holes and blind via holes such that the metal plating compositions have good throwing power and reduced cracking.

While the methods of the present invention have been generally described with reference to printed circuit board manufacture, it is appreciated that the present invention may be useful in any electrolytic process where an essentially level or planar metal deposit and filled or conformally plated apertures are desired. Such processes include, but are not limited to semiconductor packaging and interconnect manufacture as well as plating on plastics.

The following examples are intended to further illustrate the invention but are not intended to limit its scope.

Example 1

Ethylenediaminetetraacetic (EDTA) bisanhydride (10 mmoles) was dissolved in 30 mL dimethylformamide (DMF) and 10 mmoles of hexamethylenediamine (structure A) was dissolved in 30 mL of DMF. The EDTA bisanhydride solution was added into the hexamethylenediamine solution dropwise. The mixture was stirred at 60° C. for 12 hours under a nitrogen atmosphere. The reaction product was precipitated by adding 60 mL of anhydrous ethanol, then washed by acetone and dried under a vacuum. The reaction product included an inner salt as shown by structure (B).

The variable v is as defined above.

Example 2

EDTA bisanhydride (10 mmoles) was dissolved in 30 mL dimethylformamide (DMF) and 10 mmoles of the diamine shown below (structure C) was dissolved in 30 mL of DMF. The EDTA bisanhydride solution was added into the diamine solution dropwise. The mixture was stirred at 60° C. for 12 hours under a nitrogen atmosphere. The reaction product was precipitated by adding 60 mL of anhydrous ethanol, then washed by acetone and dried under a vacuum. The reaction product included an inner salt as shown by structure (D).

The variable v is as defined above.

Example 3

EDTA bisanhydride (10 mmoles) was dissolved in 30 mL dimethylformamide (DMF) and 10 mmoles of the diamine shown below (structure E) was dissolved in 30 mL of DMF. The EDTA bisanhydride solution was added into the diamine solution dropwise. The mixture was stirred at 60° C. for 12 hours under a nitrogen atmosphere. The reaction product was precipitated by adding 60 mL of anhydrous ethanol, then washed by acetone and dried under a vacuum. The reaction product included an inner salt as shown by structure (F).

The variable v is as defined above.

Example 4

EDTA bisanhydride (10 mmoles) was dissolved in 30 mL dimethylformamide (DMF) and 10 mmoles of the diamine shown below (structure G) was dissolved in 30 mL of DMF. The EDTA bisanhydride solution was added into the diamine solution dropwise. The mixture was stirred at 60° C. for 12 hours under a nitrogen atmosphere. The reaction product was precipitated by adding 60 mL of anhydrous ethanol, then washed by acetone and dried under a vacuum. The reaction product included an inner salt as shown by structure (H).

The variable v is as defined above.

Example 5

EDTA bisanhydride (10 mmoles) was dissolved in 30 mL dimethylformamide (DMF) and 10 mmoles of the diamine shown below (structure I) was dissolved in 30 mL of DMF. The EDTA bisanhydride solution was added into the diamine solution dropwise. The mixture was stirred at 60° C. for 12 hours under a nitrogen atmosphere. The product was obtained by evaporating DMF under reduced pressure. The reaction product included an inner salt as shown by structure (J).

The variable v is as defined above.

Example 6

EDTA bisanhydride (10 mmoles) was dissolved in 30 mL dimethylformamide (DMF) and 10 mmoles of the diamine shown below (structure K) was dissolved in 30 mL of DMF. The EDTA bisanhydride solution was added into the diamine solution dropwise. The mixture was stirred at 60° C. for 12 hours under a nitrogen atmosphere. The product was obtained by evaporating DMF under reduced pressure. The reaction product included an inner salt as shown by structure (L).

The variable v is as defined above.

Example 7

EDTA bisanhydride (10 mmoles) was dissolved in 30 mL dimethylformamide (DMF) and 10 mmoles of the diamine shown below (structure M) was dissolved in 30 mL of DMF. The EDTA bisanhydride solution was added into the diamine solution dropwise. The mixture was stirred at 60° C. for 12 hours under a nitrogen atmosphere. The product was obtained by evaporating DMF under reduced pressure. The reaction product included an inner salt as shown by structure (N).

where x=2.5.

The variable v is as defined above and “x” is as defined above.

Example 8

EDTA bisanhydride (10 mmoles) was dissolved in 30 mL dimethylformamide (DMF) and 10 mmoles of the diamine shown below (structure O) was dissolved in 30 mL of DMF. The EDTA bisanhydride solution was added into the diamine solution dropwise. The mixture was stirred at 60° C. for 12 hours under a nitrogen atmosphere. The reaction product was obtained by evaporating DMF under reduced pressure. The reaction product included an inner salt as shown by structure (P).

where y=12.5 and x+z=6 where x=2.5 and z=3.5.

The variables v is as defined above and “x”, “y”, and “z” are as defined above.

Example 9

Eighteen aqueous acid copper electroplating baths having the basic formulation disclosed in Table 1 below were prepared.

TABLE 1 COMPONENT AMOUNT Purified copper sulfate pentahydrate 73 g/L Sulfuric acid 235 g/L Chloride ions as hydrogen chloride 60 ppm EO/PO copolymer with a molecular weight of 1.5 g/L <5000 and terminal hydroxyl groups The pH of the baths was less than 1. The baths differed by the amount of reaction product (leveler) and brightener included in the baths. The brightener was bis(sodium-sulfopropyl)disulfide. The amount and type of leveler and brightener included in each bath is disclosed in Table 2 below.

Test panels 3.2 mm thick with average through-hole diameters of 300 μm were immersed in the aqueous acid copper electroplating baths. Copper plating was done for 80 minutes at 25° C. The current density was 2.16 ASD. The copper plated samples were analyzed to determine the throwing power (“TP”) of the plating bath, and percent cracking according to the following methods.

Throwing power was calculated by determining the ratio of the average thickness of the metal plated in the center of a through-hole compared to the average thickness of the metal plated at the surface of the test panel. The throwing power is reported in Table 2 as a percentage.

Cracking was determined according to the industry standard procedure, IPC-TM-650-2.6.8. Thermal Stress, Plated-Through Holes, published by IPC (Northbrook, Ill., USA), dated May, 2004, revision E. Each plated panel was solder floated at 288° C. six times to determine the panels resistance to cracking. If no cracking was observed, the panel passed the thermal stress test. If any cracking was observed, the panel failed the test. The results for the throwing power test and the thermal stress test are disclosed in Table 2.

TABLE 2 EXAMPLE LEVELER BRIGHTENER THERMAL (LEVELER) (ppm) (ppm) TP % STRESS TEST Example 1 10 3 78 No Example 1 10 8 77 No Example 2 10 10 96 No Example 2 1 10 83 Pass Example 2 1 5 110 No Example 3 1 10 80 No Example 3 1 5 105 No Example 3 10 3 78 No Example 3 10 8 77 No Example 4 3 10 63 Pass Example 4 1 10 73 No Example 5 3 10 64 Pass Example 6 3 10 72 Pass Example 6 1 10 108 No Example 7 3 10 57 Pass Example 7 1 10 50 Pass Example 8 3 10 58 Pass Example 8 1 10 51 Pass

Although the quality of the solder float test varied for the panels, the TP % ranged from good to very good. A TP of greater than 100% indicated that the copper thickness inside the hole was higher than on the surface. A TP of greater than 100% also indicated that the leveler showed strong polarization. 

1-6. (canceled)
 7. A method comprising: a) contacting a substrate to be metal plated with a composition comprising: one or more sources of metal ions, an electrolyte and a reaction product of one or more reaction products of one or more diamines comprising primary or secondary amine moieties and one or more compounds having formula:

where R is a linking group; b) contacting the substrate with the composition; c) applying a current to the substrate; and d) plating a metal on the substrate.
 8. The method of claim 7, wherein the one or more sources of metal ions of the electroplating composition is chosen from copper salts and tin salts.
 9. The method of claim 7, wherein the substrate comprises a plurality of through-holes and vias.
 10. The method of claim 7, wherein R comprises:

R₁, R₂, R₃ and R₄ may be the same or different and comprise hydrogen, linear or branched (C₁-C₄)alkyl, hydroxyl, hydroxy(C₁-C₃)alkyl, carboxyl, carboxy(C₁-C₃)alkyl or (C₁-C₃)alkoxy, R₅ and R₆ may be the same or different and comprise hydrogen, carboxyl and carboxy(C₁-C₃)alkyl, R₇, R₈, R₉ and R₁₀ may be the same or different and comprise hydrogen, linear or branched (C₁-C₅)alkyl, linear or branched hydroxy(C₁-C₅)alkyl, carboxy(C₁-C₃)alkyl, linear or branched (C₁-C₅)alkoxy, R₁₁ and R₁₂ may be the same or different and comprise hydrogen or linear or branched (C₁-C₅)alkyl, Ar is an aryl group having 5 to 6 carbon atoms; n and m may be the same or different and are integers of 1 to 15; and q, r and t may be the same or different are integers of 1 to
 10. 11. The reaction product of claim 7, wherein the one or more diamines comprises a formula:

R′ is a linking group and R₁₃ and R₁₄ may be the same or different and comprise hydrogen, linear or branched (C₁-C₁₂)alkyl, alkyleneoxy or substituted or unsubstituted (C₆-C₁₈)aryl.
 12. The reaction product of claim 11, wherein R′ comprises:

a substituted or unsubstituted (C₆-C₁₈)aryl; R₁₅-R₂₂ may be the same or different and comprise hydrogen, linear or branched (C₁-C₅)alkyl, linear or branched hydroxy(C₁-C₅)alkyl or linear or branched (C₁-C₅)alkoxy; and Z is a carbon atom or nitrogen atom; and p and s may be the same or different and are independently integers of one or greater, e is an integer of 0 to 3, and a, b, c and d may be the same or different and are numbers from 1 or greater.
 13. The reaction product of claim 7, wherein the one or more diamines comprises a formula:

R₂₃ and R₂₄ may be the same or different and are hydrogen or amino(C₁-C₁₀)alkyl, preferably R₂₃ and R₂₄ are hydrogen or amino(C₁-C₃)alkyl. 